Concepedia

Characterization of sputtered and annealed niobium oxide films using spectroscopic ellipsometry, Rutherford backscattering spectrometry and X-ray diffraction

Miklós Serényi, T. Lohner, P. Petrík, Z. Zolnai, Zsolt E. Horváth, N.Q. Khánh

Thin Solid Films · 2008 · 33 citations · 15 references

DOI

Concepts

References

15

Optical Properties and Electronic Structure of Amorphous Germanium

J. Tauc, R. Grigorovici, A. Vancu · physica status solidi (b) · 1966 · 10.7K citations

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Optical Properties of Solids

F. Wooten, Sumner P. Davis · American Journal of Physics · 1973 · 4.6K citations

, , +12

Parameterization of the optical functions of amorphous materials in the interband region

G. E. Jellison, F. A. Modine · Applied Physics Letters · 1996 · 2.3K citations

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Computer methods for analysis and simulation of RBS and ERDA spectra

E. Kótai · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1994 · 335 citations

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Hybrid solar cells based on MEH-PPV and thin film semiconductor oxides (TiO2, Nb2O5, ZnO, CeO2 and CeO2–TiO2): Performance improvement during long-time irradiation

Mónica Lira‐Cantú, Frederik C. Krebs · Solar Energy Materials and Solar Cells · 2006 · 210 citations

, , +17