Microwave detection of minority carriers in solar cell silicon wafers

In situ bulk lifetime measurement on silicon with a chemically passivated surface

T.S. Horányi, P. Tüttő · Applied Surface Science · 1993 · 176 citations

Engineering, Materials Engineering, Materials Science +14

Characterization of silicon wafers by transient microwave photoconductivity measurements

Aric W. Sanders, M. Kunst · Solid-State Electronics · 1991 · 49 citations

Engineering, Electrical Engineering, Materials Engineering +14

Separate contactless measurement of the bulk lifetime and the surface recombination velocity by the harmonic optical generation of the excess carriers

T. Otaredian · Solid-State Electronics · 1993 · 47 citations

Natural Sciences, Physics, Optics +15

Separation of the bulk and surface components of recombination lifetime obtained with a single laser/microwave photoconductance technique

A. Buczkowski, Z. J. Radzimski, G. A. Rozgonyi et al. · Journal of Applied Physics · 1992 · 43 citations

Engineering, Electrical Engineering, Materials Science +17

A Chemical/Microwave Technique for the Measurement of Bulk Minority Carrier Lifetime in Silicon Wafers

Keung L. Luke, Li‐Jen Cheng · Journal of The Electrochemical Society · 1988 · 28 citations

Engineering, Electrical Engineering, Materials Science +17