Characterization of silicon wafers by transient microwave photoconductivity measurements

Semiconductor Surfaces

P. J. Boddy · Surface Science · 1966 · 800 citations

Dislocation Etch for (100) Planes in Silicon

F. Secco d' Aragona · Journal of The Electrochemical Society · 1972 · 656 citations

Natural Sciences, Materials Engineering, Materials Science +17

The study of charge carrier kinetics in semiconductors by microwave conductivity measurements

M. Kunst, G. Beck · Journal of Applied Physics · 1986 · 347 citations

Natural Sciences, Materials Science, Physics +17

Analysis of the interaction of a laser pulse with a silicon wafer: Determination of bulk lifetime and surface recombination velocity

Keung L. Luke, Li‐Jen Cheng · Journal of Applied Physics · 1987 · 243 citations

Engineering, Electrical Engineering, Materials Science +17

The study of charge carrier kinetics in semiconductors by microwave conductivity measurements. II.

M. Kunst, G. Beck · Journal of Applied Physics · 1988 · 115 citations

Natural Sciences, Electrical Engineering, Materials Science +17