A. Buczkowski

Bulk and surface components of recombination lifetime based on a two-laser microwave reflection technique

A. Buczkowski, Z. J. Radzimski, G. A. Rozgonyi et al. · Journal of Applied Physics · 1991 · 50 citations

Engineering, Laser Applications, Carrier Decays +16

Recombination at clean and decorated misfit dislocations

Z. J. Radzimski, T. Q. Zhou, A. Buczkowski et al. · Applied Physics Letters · 1992 · 47 citations

Decorated Misfit Dislocations, Electrical Engineering, Engineering +14

Separation of the bulk and surface components of recombination lifetime obtained with a single laser/microwave photoconductance technique

A. Buczkowski, Z. J. Radzimski, G. A. Rozgonyi et al. · Journal of Applied Physics · 1992 · 43 citations

Transient Grating, Engineering, Optical Properties +19

Noncontact energy level analysis of metallic impurities in silicon crystals

Y. Kirino, A. Buczkowski, Z. J. Radzimski et al. · Applied Physics Letters · 1990 · 26 citations

Electrical Engineering, Engineering, Physics +12

Silicon Epitaxial Layer Lifetime Characterization

J. E. Park, D.K. Schroder, Suat-Eng Tan et al. · Journal of The Electrochemical Society · 2001 · 23 citations

Electrical Engineering, Semiconductor Device, Engineering +13