Concepedia
Microelectronics Reliability · 1990 · 11 citations · 2 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSurface EngineeringEtching ProcessesSilicon MaterialsEtch MechanismsEtchingSiliconSilicon DioxideSilicon Etching
2
Optimization of Al step coverage through computer simulation and scanning electron microscopy
I. A. Blech, D. B. Fraser, S. E. Haszko · Journal of Vacuum Science and Technology · 1978 · 33 citations · Full text
Engineering, Materials Engineering, Materials Science +17
Step coverage in the vacuum deposition of thin metal films
T. C. Tisone, J. B. Bindell · Journal of Vacuum Science and Technology · 1974 · 26 citations
Natural Sciences, Electrical Engineering, Materials Science +13