Strong element dependence of C 1s and Si 2p X-ray photoelectron diffraction profiles for identical C and Si local geometries in β-SiC

Angle-resolved x-ray photoelectron spectroscopy

C. S. Fadley · Progress in Surface Science · 1984 · 640 citations

Natural Sciences, Materials Science, Physics +9

Surface analysis of cubic silicon carbide (001)

T.M. Parrill, Y. W. Chung · Surface Science · 1991 · 116 citations

Natural Sciences, Materials Engineering, Materials Science +13

Surface structure determination with forward focused electrons

M. L. Xu, M.A. Van Hove · Surface Science · 1989 · 113 citations

Natural Sciences, Materials Engineering, Materials Science +11

Full-hemispherical photoelectron-diffraction data from Cu(001): Energy dependence and comparison with single-scattering-cluster simulations

D. Naumović, A. Stuck, Thomas Greber et al. · Physical review. B, Condensed matter · 1993 · 100 citations

Natural Sciences, Materials Science, Physics +17

Spherical-wave corrections in photoelectron diffraction

J. Mustre de León, J. J. Rehr, C. R. Natoli et al. · Physical review. B, Condensed matter · 1989 · 78 citations · Full text

Natural Sciences, Physics, Molecular Physics +16