L. K�ubler

Use of multilayer techniques for XPS identification of various nitrogen environments in the Si/NH3 system

J.L. Bischoff, F. Lutz, D. Bolmont et al. · Surface Science · 1991 · 122 citations

Natural Sciences, Materials Engineering, Materials Science +8

Photoemission study of ammonia dissociation on Si(100) below 700 K

E.K. Hlil, L. K�ubler, J.L. Bischoff et al. · Physical review. B, Condensed matter · 1987 · 115 citations

Natural Sciences, Materials Science, Physics +17

Si-H bond production by NH3 adsorption on Si(111): An UPS study

L. K�ubler, E.K. Hlil, D. Bolmont et al. · Surface Science · 1987 · 75 citations

Natural Sciences, Chemistry, Materials Science +15

Search for carbon nitride CNx compounds with a high nitrogen content by electron cyclotron resonance plasma deposition

Mustapha Diani, Azzam N. Mansour, L. K�ubler et al. · Diamond and Related Materials · 1994 · 68 citations

Natural Sciences, Chemistry, Materials Science +8

Thermal nitridation of Si(100)-2 × 1 surface by NH3: XPS results

J.L. Bischoff, L. K�ubler, D. Bolmont · Surface Science · 1989 · 51 citations

Engineering, Materials Engineering, Materials Science +14