Least‐squares fits of fundamental parameters for quantitative x‐ray analysis as a function of <i>Z</i> (11 ≤ <i>Z</i> ≤ 83) and <i>E</i> (1 keV ≤ <i>E</i> ≤ 50 keV)

Christian Poehn, J. Wernisch, Wolfgang Hanke

X-Ray Spectrometry · 1985 · 60 citations · 15 references

Concepts

Abstract

Abstract A presentation by useful approximations of fundamental parameters needed for XRF and EPMA is given. The set of fundamental parameters include: critical energy or edge energy, energy of characteristic x‐rays, edge‐jump, fluorescence yield, transition probability, mass absorption coefficient, backscatter coefficient, mean ionisation potential and atomic weight.

References

15