J. W. Criss

Calculation methods for fluorescent x-ray spectrometry. Empirical coefficients versus fundamental parameters

J. W. Criss, L. S. Birks · Analytical Chemistry · 1968 · 463 citations

X-ray Spectroscopy, Engineering, Altmetric Attention Score +22

Versatile x-ray analysis program combining fundamental parameters and empirical coefficients

J. W. Criss, L. S. Birks, John Gilfrich · Analytical Chemistry · 1978 · 140 citations

X-ray Spectroscopy, Engineering, Altmetric Attention Score +20

Fundamental-Parameters Calculations on a Laboratory Microcomputer

J. W. Criss · Advances in X-ray Analysis · 1979 · 74 citations

Engineering, X-ray Spectroscopy, Measurement +23

Particle size and composition effects in x-ray fluorescence analysis of pollution samples

J. W. Criss · Analytical Chemistry · 1976 · 66 citations

Engineering, Air Quality, Altmetric Attention Score +23

Sensitivity of x-ray films. I. A model for sensitivity in the 1–100-keV region

D. B. Brown, J. W. Criss, L. S. Birks · Journal of Applied Physics · 1976 · 42 citations

X-ray Film, X-ray Spectroscopy, Engineering +23