Improved Defect and Fourier Transform Infrared Spectroscopy Analysis for Prediction of Yield for HgCdTe Multilayer Heterostructures

D. D. Lofgreen, M. F. Vilela, E. P. G. Smith, Michael Newton, Darren R. Beard, S. M. Johnson

Journal of Electronic Materials · 2007 · 13 citations · 21 references

Concepts

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