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The evolution of the resistance of aluminum interconnects during electromigration

Materials ScienceElectrical EngineeringElectromigration TechniqueEngineeringSpecific ResistanceCorrosionInterconnect (Integrated Circuits)Applied PhysicsAluminum InterconnectsElectronic PackagingMicroelectronicsElectrochemical InterfaceElectrochemistryElectrical InsulationInterface Phenomenon