Ordinary and extraordinary dielectric functions of 4H– and 6H–SiC from 3.5 to 9.0 eV

Abstract

We report ordinary (ε⊥c axis) and extraordinary (ε∥c axis) dielectric function data of 4H– and 6H–SiC from 3.5 to 9.0 eV. These data, which were obtained by with spectroscopic ellipsometry, are also compared to recently reported ab initio calculations. Critical point energies were found using real and reciprocal space analysis.