Reciprocal Space Analysis

Reciprocal Space Analysis is a mathematical framework in X-ray crystallography that characterizes the diffraction patterns of crystalline materials by transforming spatial lattice structures into their corresponding reciprocal lattice representations, enabling the determination of atomic arrangements through the interpretation of scattered wavevector intensities and positions.

419

Publications

25.5K

Citations

1.5K

Authors

460

Institutions

Publications per year

2017–2026

55

Authors

1.5K

  1. JS
    J. Stangl

    Johannes Kepler University of Linz, Austria

    5 publications · 233 citations

    5

    h-index

  2. DE
    D. E. Aspnes

    North Carolina State University, United States

    4 publications · 111 citations

    4

    h-index

  3. GB
    G. Bauer

    Delft University of Technology, Netherlands

    4 publications · 124 citations

    4

    h-index

  4. TB
    Tilo Baumbach

    Karlsruhe Institute of Technology, Germany

    4 publications · 102 citations

    4

    h-index

  5. TH
    T. H. Metzger

    European Synchrotron Radiation Facility, France

    4 publications · 146 citations

    4

    h-index

1–5 of 1.5K

Venues

  1. Journal of Applied Crystallography

    43 publications · 1.5K citations

    21

    h-index

  2. Physical Review Letters

    PRL · 19 publications · 1.2K citations

    17

    h-index

  3. Applied Physics Letters

    20 publications · 851 citations

    16

    h-index

  4. Acta Crystallographica Section A

    20 publications · 1.2K citations

    16

    h-index

  5. 14

    h-index

1–5