Journal of Electronic Materials · 1990 · 88 citations · 9 references
Natural SciencesMaterials EngineeringMaterials ScienceMaterials CharacterizationMechanical Behavior Of MaterialsThin FilmsMechanical CharacterizationResidual StressStrength Of MaterialsStress AnalysisStress-strain BehaviorThin Film Mechanical PropertiesNitride Thin FilmsResidual Stress CharacterizationResidual Stress In Thin FilmsResidual Stress MeasurementSilicon Nitride
9
Hardness measurement at penetration depths as small as 20 nm
J. B. Pethicai, R. Hutchings, W. C. Oliver · Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties · 1983 · 924 citations
Natural Sciences, Materials Engineering, Materials Science +17
Vickers Indentation Curves of Magnesium Oxide (MgO)
Jean‐Luc Loubet, J. M. Georges, O. Marchesini et al. · Journal of Tribology · 1984 · 411 citations
Natural Sciences, Materials Engineering, Materials Science +16
Timothy P. Weihs, Soon-Il Hong, J. C. Bravman et al. · Journal of materials research/Pratt's guide to venture capital sources · 1988 · 380 citations
Natural Sciences, Materials Science, Mechanical Engineering +14