Semiconductor Science and Technology · 1996 · 49 citations · 4 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsMicroelectronicsSemiconductor DevicesDevice ReliabilityLight-emitting DiodesNoise In Electronic DevicesNoise In Semiconductor DevicesNoise MeasurementSemiconductor ReliabilityAccelerated Ageing TestAccelerated Life TestingLow-frequency NoiseNoise In Power Semiconductor DevicesNoise In Semiconductor DiodesPower Device ReliabilitySemiconductor NoiseTechnical Lifetime
Low-frequency noise (1/f noise) has been measured in light emitting diodes (LEDs) which have been subjected to an accelerated life test by means of large forward bias current pulses. Over a large range of stress pulses the electrical and functional LED properties remain unaltered but an increase in the 1/f noise level was seen and this was correlated with the device reliability. The product `initial noise X initial rate of noise increase' correlated best with the LED lifetime.
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