An Energy-Efficient ECG Processor in 45-nm CMOS Using Statistical Error Compensation

Rami A. Abdallah, Naresh R. Shanbhag

IEEE Journal of Solid-State Circuits · 2013 · 47 citations · 35 references

Concepts

Abstract

A subthreshold ECG processor in 45-nm IBM SOI CMOS is designed to operate at the minimum energy operating point (MEOP). Statistical error compensation (SEC) is employed to further reduce energy (E <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">min</sub> ) at the MEOP. SEC is shown to reduce E <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">min</sub> by 28% compared with the conventional (error-free) case while maintaining acceptable beat-detection performance. SEC enables the supply voltage to be scaled to 15% below its critical value at MEOP, while compensating for a 58% precorrection error rate p <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">e</sub> . These results represent an improvement of 19× in beat-detection performance and 600× in p <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">e</sub> over conventional (error-free) systems. The prototype IC consumes 14.5 fJ/cycle/1k-gate and exhibits 4.7× better energy efficiency than the state of the art while tolerating 16× more voltage variations.

References

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