Avoiding MEMS failures

Srikanth Lavu, Marc P. Y. Desmulliez, Ingrid De Wolf, M. Begbie, George Bell

Electronic Systems and Software · 2005 · 10 citations · 0 references

Concepts

Abstract

As MEMS devices becomes more common, understanding their failure mechanisms has become critical. Failure mode and effect analysis provides a way of making the assessment of potential failures a systematic process.