Publication | Closed Access
Ranges and electronic stopping powers of 1–24 MeV 12C and 14N ions in Si targets from optical reflectivity measurements on bevelled samples
17
Citations
6
References
1986
Year
EngineeringBevelled SamplesPhysicsOptical PropertiesApplied PhysicsOptical Reflectivity MeasurementsIon Beam InstrumentationIon BeamMev 12CInstrumentationIon Emission
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