Japanese Journal of Applied Physics · 2000 · 193 citations · 16 references
EngineeringMaterials EngineeringMaterials ScienceOptoelectronicsSemiconductor DevicesSemiconductor MaterialsLight-emitting DiodesLuminescent MaterialsSemiconductor Device MaterialsSemiconductor HeterostructuresSemiconductor PhysicsSilicon MaterialsCurrent DensityElectroluminescenceLight-emitting Diode MaterialsMolecular Beam EpitaxyPhotoluminescenceSemiconductor Light-emitting MaterialsSilicon Device MaterialsSilicon Epitaxy
Room temperature electroluminescence (EL) was obtained for the first time from a Si-based light emitting diode with semiconducting silicide (β-FeSi 2 ) active region. The peak wavelength was 1.6 µm and it is from β-FeSi 2 balls embedded in a Si p-n junction. An a -axis oriented β-FeSi 2 layer was grown on n + -(001) Si by reaction deposition epitaxy (RDE), then p- and p + -Si layers were grown by molecular beam epitaxy (MBE). The β-FeSi 2 aggregated into balls with about 100 nm diameter in this process. The EL intensity increased superlinearly with increase of the injected current density, and reasonable EL was obtained at current density above 10 A/cm 2 , though the photoluminescence (PL) was difficult to be detected at room temperature.
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Quantum size effects on photoluminescence in ultrafine Si particles
H. Takagi, H. Ogawa, Yuzo Yamazaki et al. · Applied Physics Letters · 1990 · 874 citations
A silicon/iron-disilicide light-emitting diode operating at a wavelength of 1.5 μm
D. Leong, M. Harry, K.J. Reeson et al. · Nature · 1997 · 718 citations