SWITTEST

Abstract

A tool for the switch-level fault simulation and test evaluationof switched-capacitor systems is presented. Time or frequency-domainfault simulations with SWITCAP and time-domain faultsimulations with HSPICE can be performed. Adequate fault modelsare presented for both simulators. The tool has proven to bevery useful in the early evaluation of test strategies, providing similarresults to those obtained at the transistor-level.