Microelectronic Engineering · 2004 · 12 citations · 14 references
EngineeringElectrical EngineeringMaterials EngineeringMicroelectronicsSemiconductor DevicesSemiconductor MaterialsCurrent DistributionCurrent-voltage CharacteristicsDevice CharacterizationDevice ModelingElectronics TechnologySilicon MaterialsCurrent-voltage CharacterizationCurrent-voltage RelationsTemporal StabilityTemporal Stability AnalysisTemporal Stability AssessmentTransient Current Spectroscopy
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Field-emitter arrays for vacuum microelectronics
C.A. Spindt, C.E. Holland, A. Rosengreen et al. · IEEE Transactions on Electron Devices · 1991 · 360 citations
Formation of silicon tips with <1 nm radius
R. B. Marcus, T. S. Ravi, T. J. Gmitter et al. · Applied Physics Letters · 1990 · 261 citations