Publication | Closed Access
Investigation of HfO2 and ZrO2 for Resistive Random Access Memory applications
28
Citations
14
References
2012
Year
Non-volatile MemoryElectrical EngineeringEngineeringEmerging Memory TechnologyApplied PhysicsMemory DeviceMemory DevicesSemiconductor MemoryResistive Random-access MemoryMicroelectronics
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