IEEE Photonics Technology Letters · 2013 · 36 citations · 9 references
EngineeringElectrical EngineeringMaterials ScienceOptoelectronicsPhotonicsSemiconductor DevicesDevice ReliabilityFiber OpticsLaser DiodesReliabilitySemiconductor LasersSemiconductor ReliabilityDevice DegradationLifetime EstimationLifetime PredictionLong-term Device ReliabilityReliability DegradationReliability Degradation MechanismsReliability PhysicsWafer Materials
Wafer fusion vertical cavity surface emitting laser (VCSEL) technology has produced devices that successfully passed all mechanical and electrical Telcordia qualification tests. Accelerated lifetime tests result in times to 1% failure at 70 <formula formulatype="inline" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"><tex Notation="TeX">$^{\circ}{\rm C}$</tex></formula> of 18 years and 30 years at VCSEL driving currents of 9 and 8 mA, respectively. These lifetimes meet the telecom industry reliability requirements for applications in fiber-optic communications networks.
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THE INSTITUTEOF ELECTRICAL AND ELECTRONICS ENGINEERS,INC.
Hendley Blackmon, E. L. Harder, S. Saito et al. · 1966 · 1.4K citations
High-performance single-mode VCSELs in the 1310-nm waveband
V. Iakovlev, G. Suruceanu, A. Caliman et al. · IEEE Photonics Technology Letters · 2005 · 61 citations · Full text
A. Mircéa, A. Caliman, V. Iakovlev et al. · IEEE Photonics Technology Letters · 2007 · 46 citations · Full text