Effect of deep cryogenic temperature on silicon-on-insulator CMOS mismatch: A circuit designer’s perspective

Matching properties of MOS transistors

Marcel Pelgrom, Aad C.J. Duinmaijer, A.P.G. Welbers · IEEE Journal of Solid-State Circuits · 1989 · 3.3K citations

Device Modeling, Electrical Engineering, Engineering +10

DIGEST of TECHNICAL PAPERS

Richard S. Engelbrecht, Hsiung Hsu, Parametric Amplifiers et al. · 1959 · 1.4K citations

Document Analysis, Technical Papers, Science And Technology Studies +1

New method for the extraction of MOSFET parameters

G. Ghibaudo · Electronics Letters · 1988 · 822 citations

Numerical Analysis, Device Modeling, Electrical Engineering +9

1995 IEEE International Symposium on Circuits and Systems

1995 · 727 citations

Electrical Engineering, Engineering, Ieee International Symposium +7

Device mismatch and tradeoffs in the design of analog circuits

Peter R. Kinget · IEEE Journal of Solid-State Circuits · 2005 · 471 citations

Electrical Engineering, Engineering, Vlsi Design +11