Journal of Alloys and Compounds · 2009 · 79 citations · 32 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsCurrent-voltage CharacteristicsMetal-semiconductor ContactsMos CapacitorsSemiconductor Device MaterialsSemiconductor InterfacesSemiconductor SurfacesCapacitance-voltage CharacteristicsCapacitance-voltage CharacterizationCapacitance-voltage MeasurementsCurrent-voltage CharacterizationCurrent-voltage RelationsCurrent-voltage RelationshipSchottky Barrier CharacteristicsSchottky Contacts
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Barrier inhomogeneities at Schottky contacts
J.H. Werner, H. Güttler · Journal of Applied Physics · 1991 · 1.6K citations
M. Pepper · Physics in Technology · 1974 · 1.1K citations