Reciprocal space mapping and single-crystal scattering rods

Abstract

Reciprocal space mapping using a linear gas detector in combination with a matching Soller collimator has been applied to map scattering rods of well oriented organic microcrystals grown on a solid surface. Formulae are provided to correct image distortions in angular space and to determine the required oscillation range, in order to measure properly integrated scattering intensities.