Reciprocal Space Mapping
Reciprocal Space Mapping is a diffraction-based analytical technique that distinguishes itself within structural characterization methods by enabling the precise visualization of crystallographic reflections in reciprocal space to determine lattice parameters, phase composition, and strain states in epitaxial thin films and single crystals.
398
Publications
13.1K
Citations
2K
Authors
476
Institutions
Publications per year
2017–2026
90
398
1–5 of 398
2K
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476

Centre National de la Recherche Scientifique
Paris, France
17 h-index
104 publications
3.5K citations

Johannes Kepler University of Linz
Linz, Austria
15 h-index
85 publications
3.4K citations
Tokyo Institute of Technology
Tokyo, Japan
13 h-index
68 publications
1.8K citations

Chinese Academy of Sciences
Beijing, China
12 h-index
60 publications
1.4K citations

Cornell University
Ithaca, United States
12 h-index
28 publications
1.2K citations
Argonne National Laboratory
Lemont, United States
11 h-index
42 publications
1.1K citations

Université Grenoble Alpes
Saint-Martin-d'Hères, France
10 h-index
43 publications
1.1K citations
Commissariat à l'Énergie Atomique et aux Énergies Alternatives
Paris, France
10 h-index
35 publications
1.1K citations
1–8 of 476
76 publications · 2.9K citations
32
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57 publications · 1.9K citations
25
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28 publications · 1K citations
16
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23 publications · 507 citations
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JJAP · 24 publications · 522 citations
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