Reciprocal Space Mapping

Reciprocal Space Mapping is a diffraction-based analytical technique that distinguishes itself within structural characterization methods by enabling the precise visualization of crystallographic reflections in reciprocal space to determine lattice parameters, phase composition, and strain states in epitaxial thin films and single crystals.

398

Publications

13.1K

Citations

2K

Authors

476

Institutions

Publications per year

2017–2026

90

Authors

2K

  1. VH
    V. Holý

    Charles University, Czechia

    16 publications · 540 citations

    12

    h-index

  2. KS
    Keisuke Saito

    Tokyo Institute of Technology, Japan

    13 publications · 354 citations

    11

    h-index

  3. HF
    Hiroshi Funakubo

    Tokyo Institute of Technology, Japan

    12 publications · 360 citations

    10

    h-index

  4. TB
    Tilo Baumbach

    Karlsruhe Institute of Technology, Germany

    8 publications · 178 citations

    8

    h-index

  5. AA
    Anton A. Darhuber

    Eindhoven University of Technology, Netherlands

    8 publications · 358 citations

    8

    h-index

1–5 of 2K

Venues

  1. Applied Physics Letters

    76 publications · 2.9K citations

    32

    h-index

  2. Journal of Applied Physics

    57 publications · 1.9K citations

    25

    h-index

  3. Journal of Applied Crystallography

    28 publications · 1K citations

    16

    h-index

  4. Journal of Physics D Applied Physics

    23 publications · 507 citations

    15

    h-index

  5. Japanese Journal of Applied Physics

    JJAP · 24 publications · 522 citations

    14

    h-index

1–5