IEEE Electron Device Letters · 1983 · 17 citations · 4 references
EngineeringElectrical EngineeringElectronic MaterialsMicroelectronicsMicrowave EngineeringElectron TransportHigh-frequency Semiconductor DevicesMicrowave Device SimulationMicrowave Semiconductor DevicesWide-bandgap Semiconductor DevicesMicrowave DevicesMillimeter-wave TransistorsRadio-frequency Devices
Systematic simulations of n <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">+</sup> -n-n <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">+</sup> InP millimeter-wave transferred-electron devices have been performed in order to define the frequency limitation of the fundamental accumulation transmit mode, as well as the maximum RF performance of these devices. The simulations indicate that the use of n <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">+</sup> -n-n <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">+</sup> InP devices yields significant net output powers and efficiencies up to 160 GHz, according to the present state of technology.
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Hot-electron relaxation effects in devices
H. Kroemer · Solid-State Electronics · 1978 · 60 citations