Imaging Si nanoparticles embedded in SiO2 layers by (S)TEM-EELS - Concepedia

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Imaging Si nanoparticles embedded in SiO2 layers by (S)TEM-EELS

73

Citations

35

References

2007

Year

C. Bonafos, H. Coffin, N. Cherkashin, M. Carrada, Gérard Assayag, A. Claverie, Marcel Tencé, C. Colliex

Ultramicroscopy

Nanoscale ScienceEngineeringNanomaterialsNanotechnologySi NanoparticlesSurface ScienceApplied PhysicsSiliceneSilicon On Insulator

References

	Year	Citations

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