Japanese Journal of Applied Physics · 1980 · 29 citations · 1 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsSemiconductor DevicesSemiconductor MaterialsCmos Circuit DesignDevice CharacterizationDevice ModelingIntegrated Circuit DesignSemiconductor Device MaterialsSemiconductor InterfacesCapacitanceCharge TrappingDeep DepletionInterface Trap DensityJunction CapacitanceSiliconTraps
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