Review of Scientific Instruments · 2015 · 19 citations · 24 references
Natural SciencesMaterials EngineeringMaterials ScienceCondensed Matter PhysicsSurface ScienceThin FilmsThin-film DepositionX-ray CrystallographyX-ray Data AnalysisX-ray DetectionX-ray DetectorsX-ray DiffractionCathodic Arc DepositionHigh-vacuum DepositionMagnetron SputteringSmall-angle X-ray ScatteringSputteringSynchrotron X-ray DiffractionThin Film Growth MonitoringThin-film Growth Mechanisms
We present an industry-relevant, large-scale, ultra-high vacuum (UHV) magnetron sputtering and cathodic arc deposition system purposefully designed for time-resolved in situ thin film deposition/annealing studies using high-energy (>50 keV), high photon flux (>10(12) ph/s) synchrotron radiation. The high photon flux, combined with a fast-acquisition-time (<1 s) two-dimensional (2D) detector, permits time-resolved in situ structural analysis of thin film formation processes. The high-energy synchrotron-radiation based x-rays result in small scattering angles (<11°), allowing large areas of reciprocal space to be imaged with a 2D detector. The system has been designed for use on the 1-tonne, ultra-high load, high-resolution hexapod at the P07 High Energy Materials Science beamline at PETRA III at the Deutsches Elektronen-Synchrotron in Hamburg, Germany. The deposition system includes standard features of a typical UHV deposition system plus a range of special features suited for synchrotron radiation studies and industry-relevant processes. We openly encourage the materials research community to contact us for collaborative opportunities using this unique and versatile scientific instrument.
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The High Energy Materials Science Beamline (HEMS) at PETRA III
Norbert Schell, Andrew King, Felix Beckmann et al. · Materials science forum · 2013 · 251 citations · Full text
Surface diffraction beamline at ESRF
S. Ferrer, F. Comin · Review of Scientific Instruments · 1995 · 124 citations · Full text