3D MEMS Simulation Modeling Using Modified Nodal Analysis

J V Clark, Ningning Zhou, David Bindel, Luca Schenato, Weimin Wu, James Demmel, Kristofer S. J. Pister

2001 · 29 citations · 5 references

Concepts

Abstract

The modeling, simulation, and experimental verification of several MEMS devices are presented. Simulated results include 3D mode analysis, residual stress effects, thermal expansion, nonlinear deflections, time-varying electrostatic forces, process sensitivities, induced currents, and the transient performance in accelerated reference frames. To simulate the performance of these MEMS devices a modified nodal analysis approach is used to formulate a system of ODEs that is solved by static, steady state, and transient solvers. Index Terms - SUGAR, modified nodal analysis, static, steady state, transient, accelerating frames, sensitivity. 1

References

5