Japanese Journal of Applied Physics · 1981 · 77 citations · 10 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor MaterialsSolid State PhysicsCrystal GrowthElectronic Band StructureEpitaxial GrowthSemiconductor Crystal GrowthX-ray CrystallographyX-ray DiffractionBand GapBand Gap EnergyEpitaxial MaterialsGallium Arsenide Crystal GrowthInorganic CrystalsMass Transport EffectsPhotoresponse CharacterizationX-ray Diffraction Analysis
InAs 1- x - y Sb x P y quaternary alloy lattice matched to InAs was successfully grown by organometallic vapor phase epitaxial growth. In a fairly wide composition range (0≦ x + y ≦0.7) the grown quaternary layer exhibited a mirror-smooth surface and a sharp X-ray diffraction spectrum. Full widths of half-maximum of X-ray rocking curve were 20–30''. The growth rate is limited by the mass transport of indium. The miscibility gap extent was found in the low arsenic composition region ( x + y >0.7). The band gap energy of the quaternary layer lattice matched to InAs was obtained from photoresponse measurements. The bowing parameter for the band gap energy of the InSb x P 1- x mixed crystal system is estimated to be 1.6±0.3 eV.
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Electron mobilities in modulation-doped semiconductor heterojunction superlattices
R. Dingle, H. L. Störmer, A. C. Gossard et al. · Applied Physics Letters · 1978 · 1.5K citations
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X-ray study of AlxGa1−xAs epitaxial layers
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Natural Sciences, Materials Engineering, Materials Science +17