Photoresponse Characterization

Photoresponse Characterization is a systematic analytical framework used in device characterization that quantifies the electrical or optical response of a photosensitive device to incident light stimuli, distinguishing itself by its focus on temporal, spectral, and intensity-dependent responsivity metrics under controlled illumination conditions.

637

Publications

32.5K

Citations

3K

Authors

815

Institutions

Publications per year

2017–2026

199

Authors

3K

  1. FY
    F. Yakuphanoğlu

    Fırat University, Türkiye

    7 publications · 200 citations

    7

    h-index

  2. JZ
    Jianxin Zhong

    Xiangtan University, China

    6 publications · 318 citations

    6

    h-index

  3. XQ
    Xiang Qi

    Xiangtan University, China

    6 publications · 277 citations

    6

    h-index

  4. GK
    G. K. Solanki

    Sardar Patel University, India

    6 publications · 137 citations

    6

    h-index

  5. WT
    Weihua Tang

    Beijing University of Posts and Telecommunications, China

    5 publications · 183 citations

    5

    h-index

1–5 of 3K

Venues

  1. Applied Physics Letters

    73 publications · 3.5K citations

    35

    h-index

  2. Journal of Applied Physics

    31 publications · 1.6K citations

    21

    h-index

  3. Journal of Alloys and Compounds

    15 publications · 663 citations

    14

    h-index

  4. RSC Advances

    17 publications · 527 citations

    13

    h-index

  5. Nanotechnology

    13 publications · 528 citations

    13

    h-index

1–5