Microstructural evaluation and failure analysis of Ag wire bonded to Al pads

Miri Choi, Hyung Giun Kim, Taeg-Woo Lee, Young-Jun Jeon, Yong-Keun Ahn, K.M. Koo, You‐Cheol Jang, So‐Yeon Park, Jae-Hak Yee, Nam-Kwon Cho,

Microelectronics Reliability · 2015 · 18 citations · 34 references

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References

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