Microelectronics Reliability · 2015 · 18 citations · 34 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsMaterials CharacterizationMetallic MaterialsDamage MechanicsMetalsMicrostructure AnalysisSemiconductor ReliabilityAluminium AlloysAluminum InterconnectsBond StrengthBonded Interface FailureMicrostructural CharacterizationMicrostructural DegradationWire BondingWire Material Properties
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Behavior of aluminum oxide, intermetallics and voids in Cu–Al wire bonds
Huining Xu, C. Liu, Vadim V. Silberschmidt et al. · Acta Materialia · 2011 · 246 citations
Natural Sciences, Materials Engineering, Materials Science +12