Bennetts Associates

IJTAG (Internal JTAG): A Step Toward a DFT Standard

Jeff Rearick, Bill Eklow, K. Posse et al. · 2006 · 52 citations

Hardware Security, Engineering, Inspection +15

Macro Testability; The Results of Production Device Applications

F. Bouwman, S. Oostdijk, R. Stans et al. · 2005 · 46 citations

Engineering, System Testing, Program Analysis +9

IEEE P1687: Toward Standardized Access of Embedded Instrumentation

K. Posse, Al Crouch, Jeff Rearick et al. · Proceedings/Proceedings - International Test Conference · 2006 · 26 citations

Engineering, Draft Standard, Computer Architecture +23

Minimizing pattern count for interconnect test under a ground bounce constraint

Erik Jan Marinissen, Bart Vermeulen, Henk D. L. Hollmann et al. · IEEE Design & Test of Computers · 2003 · 26 citations

Pattern Count, Ground Bounce Problems, Engineering +13

Durability in high humidity of glass-to-lead alloy joints bonded with an epoxide adhesive

J. Comyn, C.L. Groves, R.W. Saville · International Journal of Adhesion and Adhesives · 1994 · 25 citations

Materials Engineering, Materials Science, High Humidity +9