Shape Change Technologies (United States)

Substrate Noise Coupling in SoC Design: Modeling, Avoidance, and Validation

Ali Afzali‐Kusha, Makoto Nagata, Nishath Verghese et al. · Proceedings of the IEEE · 2006 · 112 citations

Engineering, Vlsi Design, Computer Architecture +17

Automated full-chip hotspot detection and removal flow for interconnect layers of cell-based designs

Ed Roseboom, Mark Rossman, Fang-Cheng Chang et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2007 · 40 citations

Engineering, Electronic Design Automation, Digital Manufacturing +22

Context-specific leakage and delay analysis of a 65nm standard cell library for lithography-induced variability

Dar-sun Tsien, Chien Kuo Wang, Yajun Ran et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2007 · 19 citations

Engineering, Vlsi Design, Electron-beam Lithography +22

Context-specific leakage and delay analysis of a 65nm standard cell library for lithography-induced variability

Darsun Tsiena, Chien Kuo Wang, William W.J. Wang et al. · 2007 · 15 citations

Engineering, Vlsi Design, Electron-beam Lithography +22

Model-based approach for design verification and co-optimization of catastrophic and parametric-related defects due to systematic manufacturing variations

Dan Perry, Mark Nakamoto, Nishath Verghese et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2007 · 10 citations

Engineering, Electrical Dfm Methodology, Industrial Engineering +25