Philippe Hurat

Automated full-chip hotspot detection and removal flow for interconnect layers of cell-based designs

Ed Roseboom, Mark Rossman, Fang-Cheng Chang et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2007 · 40 citations

Engineering, Electronic Design Automation, Digital Manufacturing +22

Layout printability optimization using a silicon simulation methodology

Michel Côté, Philippe Hurat · 2004 · 30 citations

Engineering, Electronic Design Automation, Computer-aided Design +18

DFM: linking design and manufacturing

S. Raghvendra, Philippe Hurat · 2005 · 20 citations

Engineering, Electron-beam Lithography, Industrial Engineering +22

Context-specific leakage and delay analysis of a 65nm standard cell library for lithography-induced variability

Dar-sun Tsien, Chien Kuo Wang, Yajun Ran et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2007 · 19 citations

Engineering, Vlsi Design, Electron-beam Lithography +22

Context-specific leakage and delay analysis of a 65nm standard cell library for lithography-induced variability

Darsun Tsiena, Chien Kuo Wang, William W.J. Wang et al. · 2007 · 15 citations

Engineering, Vlsi Design, Electron-beam Lithography +22