Concepedia

Testability-driven Synthesis

Testability-Driven Synthesis is a logic synthesis methodology that belongs to the class of design-for-testability techniques, distinguished by its explicit optimization of circuit structures during synthesis to enhance the ease and effectiveness of fault detection and test generation.

57

Publications

1.7K

Citations

120

Authors

57

Institutions

Publications per year

2017–2026

1

Parents

Publications

57

Recent developments in high-level synthesis

Youn-Long Lin · ACM Transactions on Design Automation of Electronic Systems · 1997 · 117 citations · Full text

, , +17

Easily testable realizations for logic functions

S.M. Reddy · Computer-Aided Design · 1973 · 96 citations

, , +14

Incorporating testability considerations in high-level synthesis

A. Mujumdar, Rajiv Jain, Kewal K. Saluja · Journal of Electronic Testing · 1994 · 75 citations

, , +11

A design for testability scheme with applications to data path synthesis

S. Chiu, C. Papachristou · 1991 · 74 citations · Full text

, , +11

Synthesis of robust delay-fault-testable circuits: practice

Srinivas Devadas, Kurt Keutzer · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1992 · 60 citations

, , +15

1–5 of 57

Authors

120

  1. KK
    Kurt Keutzer

    University of California, Berkeley, United States

    4 publications · 137 citations

    4

    h-index

  2. SR
    S.M. Reddy

    University of Iowa, United States

    4 publications · 172 citations

    4

    h-index

  3. CP
    C. Papachristou

    Case Western Reserve University, United States

    4 publications · 222 citations

    4

    h-index

  4. IP
    Irith Pomeranz

    University of Iowa, United States

    3 publications · 52 citations

    3

    h-index

  5. SD
    Srinivas Devadas

    Massachusetts Institute of Technology, United States

    3 publications · 109 citations

    3

    h-index

1–5 of 120

Institutions

57

  1. Case Western Reserve University

    Cleveland, United States

    5 h-index

    11 publications

    576 citations

  2. University of Iowa

    Iowa City, United States

    5 h-index

    9 publications

    213 citations

  3. Politecnico di Milano

    Milan, Italy

    3 h-index

    10 publications

    144 citations

  4. University of Illinois Urbana-Champaign

    Urbana, United States

    3 h-index

    5 publications

    91 citations

  5. Princeton University

    Princeton, United States

    3 h-index

    3 publications

    80 citations

  6. Politecnico di Torino

    Turin, Italy

    3 h-index

    6 publications

    94 citations

  7. University of Wisconsin–Madison

    Madison, United States

    3 h-index

    7 publications

    359 citations

  8. Synopsys (United States)

    Mountain View, United States

    3 h-index

    3 publications

    118 citations

1–8 of 57

Venues

  1. 7

    h-index

  2. Journal of Electronic Testing

    JETTA · 3 publications · 133 citations

    3

    h-index

  3. ACM Transactions on Design Automation of Electronic Systems

    TODAES · 2 publications · 136 citations

    2

    h-index

  4. IEEE Transactions on Computers

    2 publications · 54 citations

    2

    h-index

  5. IEEE Design & Test of Computers

    2 publications · 47 citations

    2

    h-index

1–5