Concepedia

Test Planning Methodology

Test Planning Methodology is a systematic framework within the domain of vehicle development that prescribes the principles, processes, and criteria for designing, organizing, and executing test activities to ensure comprehensive evaluation of vehicle performance, safety, and compliance throughout the product lifecycle.

128

Publications

4.2K

Citations

396

Authors

167

Institutions

Publications per year

2017–2026

23

Parents

Publications

128

Accelerated Degradation Test Planning Using the Inverse Gaussian Process

Zhi‐Sheng Ye, Liangpeng Chen, Loon Ching Tang et al. · IEEE Transactions on Reliability · 2014 · 200 citations

, , +12

A bibliography of accelerated test plans

Wayne Nelson · IEEE Transactions on Reliability · 2005 · 178 citations

, , +9

Efficient object-oriented integration and regression testing

Yves Le Traon, Thierry Jéron, Jean‐Marc Jezéquél et al. · IEEE Transactions on Reliability · 2000 · 130 citations

, , +17

Testing Scenario Library Generation for Connected and Automated Vehicles, Part II: Case Studies

Shuo Feng, Yiheng Feng, Haowei Sun et al. · IEEE Transactions on Intelligent Transportation Systems · 2020 · 121 citations · Full text

, , +11

National Cyber Range Overview

Bernard C Ferguson, Anne M. Tall, Denise Olsen · 2014 · 103 citations

, , +13

1–5 of 128

Authors

396

  1. SO
    Sule Ozev

    Arizona State University, United States

    4 publications · 75 citations

    4

    h-index

  2. MN
    Mehrdad Nourani

    The University of Texas at Dallas, United States

    4 publications · 92 citations

    4

    h-index

  3. KC
    Krishnendu Chakrabarty

    Duke University, United States

    4 publications · 63 citations

    4

    h-index

  4. YL
    Yves Le Traon

    University of Luxembourg, Luxembourg

    3 publications · 177 citations

    3

    h-index

  5. GM
    G. M. Graham

    Heriot-Watt University, United Kingdom

    2 publications · 119 citations

    2

    h-index

1–5 of 396

Institutions

167

  1. IBM (United States)

    Armonk, United States

    8 h-index

    24 publications

    480 citations

  2. Duke University

    Durham, United States

    5 h-index

    14 publications

    245 citations

  3. Institut de Recherche en Informatique et Systèmes Aléatoires

    Rennes, France

    3 h-index

    9 publications

    618 citations

  4. Intel (United States)

    Santa Clara, United States

    3 h-index

    5 publications

    239 citations

  5. University of Michigan

    Ann Arbor, United States

    3 h-index

    9 publications

    681 citations

  6. The University of Texas at Dallas

    Richardson, United States

    3 h-index

    4 publications

    98 citations

  7. Texas Instruments (United States)

    Dallas, United States

    3 h-index

    4 publications

    47 citations

  8. Case Western Reserve University

    Cleveland, United States

    2 h-index

    2 publications

    66 citations

1–8 of 167

Venues

  1. 4

    h-index

  2. IEEE Transactions on Reliability

    4 publications · 537 citations

    4

    h-index

  3. Journal of Electronic Testing

    JETTA · 3 publications · 57 citations

    3

    h-index

  4. European Journal of Operational Research

    2 publications · 77 citations

    2

    h-index

  5. 2

    h-index

1–5