State Retention Techniques

State Retention Techniques is a power management methodology in low-power integrated circuit design that selectively preserves the operational state of idle circuit components through localized retention registers or memory elements, thereby enabling rapid resumption of activity while minimizing leakage energy during standby modes.

31

Publications

986

Citations

118

Authors

33

Institutions

Publications per year

2017–2026

7

Authors

118

  1. GV
    Geoff V. Merrett

    University of Southampton, United Kingdom

    3 publications · 45 citations

    3

    h-index

  2. DF
    David Flynn

    Heriot-Watt University, United Kingdom

    3 publications · 33 citations

    3

    h-index

  3. RP
    Rubin Parekhji

    Texas Instruments (India), India

    2 publications · 44 citations

    2

    h-index

  4. DB
    Domenico Balsamo

    University of Southampton, United Kingdom

    2 publications · 33 citations

    2

    h-index

  5. KC
    Krishnendu Chakrabarty

    Duke University, United States

    2 publications · 44 citations

    2

    h-index

1–5 of 118

Venues

  1. IEEE Journal of Solid-State Circuits

    2 publications · 85 citations

    2

    h-index

  2. 1

    h-index

  3. IET Computers & Digital Techniques

    1 publications · 10 citations

    1

    h-index

  4. IEEE Transactions on Parallel and Distributed Systems

    TPDS · 1 publications · 30 citations

    1

    h-index

  5. ACM Transactions on Software Engineering and Methodology

    TOSEM · 1 publications · 25 citations

    1

    h-index

1–5