2018 · 125 citations · 6 references
EngineeringComputer EngineeringElectrical EngineeringElectronic MaterialsMicroelectronicsSemiconductor DevicesCmos Circuit DesignDevice ScalingIntegrated Circuit DesignMemory DevicesMetal-oxide-semiconductor Field-effect TransistorsArea Ratio DesignDepolarizationDepolarization EffectsDepolarization FieldDevice OptimizationEnduranceState Retention DesignState Retention Techniques
We demonstrate an SoC logic compatible ferroelectric-metal field effect transistor (FeMFET) digital 2-bit weight cell by monolithic BEOL integration of a ferroelectric (FE) capacitor with the gate of a conventional Si HK/MG MOSFET. Through optimization of the area ratio between the FE capacitor and the MOSFET, we show: 1) program/erase write voltages can be scaled down to logic compatible level, ±1.8 V, simplifying write circuitry; 2) write speed of 100ns; 3) write endurance cycles without degradation due to elimination of charge trapping in FE; 4) 2 bits/cell achieving software levels of accuracy for inference on MNIST training database; 5) state retention approaching 10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">4</sup> s for a depolarization field of 0.3 MV/cm; 6) Multi-port (independent read and write) operations.
6
A Circuit Compatible Accurate Compact Model for Ferroelectric-FETs
Kai Ni, Matthew Jerry, J. A. Smith et al. · 2018 · 240 citations
Engineering, Computer Engineering, Electrical Engineering +16