Concepedia

Robustness Testing Methodology

Robustness Testing Methodology is a systematic framework within electrostatic discharge protection that defines procedures, conditions, and criteria for evaluating the resilience of electronic components and systems against transient electrical overstress events, distinguishing itself by its focus on quantifying performance degradation and failure thresholds under controlled, repeatable, and extreme operational or environmental stresses.

127

Publications

4.8K

Citations

450

Authors

156

Institutions

Publications per year

2017–2026

29

Parents

Publications

127

Guidance for robustness/ruggedness tests in method validation

Yvan Vander Heyden, Arend Nijhuis, J. Smeyers–Verbeke et al. · Journal of Pharmaceutical and Biomedical Analysis · 2001 · 630 citations

, , +9

Digital transformation, risk-taking, and innovation: Evidence from data on listed enterprises in China

Meiyu Liu, Chengyou Li, Qinghai Li · Journal of Innovation & Knowledge · 2023 · 295 citations · Full text

, , +16

Robustness testing of PLS, LISREL, EQS and ANN-based SEM for measuring customer satisfaction

Sheng-Hsun Hsu, Wun-hwa Chen, Ming-jyh Hsieh · Total Quality Management & Business Excellence · 2006 · 207 citations

, , +15

Automated robustness testing of off-the-shelf software components

N.P. Kropp, Philip Koopman, Daniel P. Siewiorek · 1998 · 183 citations

, , +15

The use of the Box–Behnken experimental design in the optimisation and robustness testing of a capillary electrophoresis method for the analysis of ethambutol hydrochloride in a pharmaceutical formulation

Ruby Ragonese, Mirek Macka, Jeff G. Hughes et al. · Journal of Pharmaceutical and Biomedical Analysis · 2002 · 154 citations · Full text

, , +16

1–5 of 127

Authors

450

  1. YV
    Yvan Vander Heyden

    Vrije Universiteit Brussel, Belgium

    6 publications · 824 citations

    6

    h-index

  2. PK
    Philip Koopman

    Carnegie Mellon University, United States

    4 publications · 328 citations

    4

    h-index

  3. GG
    G. Groeseneken

    IMEC, Belgium

    4 publications · 74 citations

    4

    h-index

  4. MS
    M. Sawada

    KU Leuven, Belgium

    3 publications · 55 citations

    3

    h-index

  5. DP
    David Pommerenke

    Missouri University of Science and Technology, United States

    3 publications · 121 citations

    3

    h-index

1–5 of 450

Institutions

156

  1. Vrije Universiteit Brussel

    Brussels, Belgium

    10 h-index

    25 publications

    2.7K citations

  2. Centre National de la Recherche Scientifique

    Paris, France

    5 h-index

    10 publications

    294 citations

  3. Analog Devices (United States)

    Norwood, United States

    5 h-index

    14 publications

    264 citations

  4. IMEC

    Leuven, Belgium

    4 h-index

    20 publications

    362 citations

  5. KU Leuven

    Leuven, Belgium

    4 h-index

    6 publications

    165 citations

  6. Carnegie Mellon University

    Pittsburgh, United States

    4 h-index

    16 publications

    1.2K citations

  7. University of Coimbra

    Coimbra, Portugal

    4 h-index

    10 publications

    324 citations

  8. University of Tübingen

    Tübingen, Germany

    3 h-index

    11 publications

    282 citations

1–8 of 156

Venues

  1. 5

    h-index

  2. Microelectronics Reliability

    4 publications · 79 citations

    4

    h-index

  3. Electrical Overstress/Electrostatic Discharge Symposium

    Conference · 4 publications · 56 citations

    4

    h-index

  4. 3

    h-index

  5. Journal of Chromatography A

    3 publications · 170 citations

    3

    h-index

1–5