M. Sawada

Calibrated wafer-level HBM measurements for quasi-static and transient device analysis

Mirko Scholz, S. Thijs, D. Linten et al. · 2007 · 41 citations

Engineering, Electrical Engineering, Microelectronics +11

Obesity and Smoking: Relationship with Waist Circumference and Obesity-Related Disorders in Men Undergoing a Health Screening

Osamu Mizuno, Kiyoshi Okamoto, M. Sawada et al. · Journal of Atherosclerosis and Thrombosis · 2005 · 32 citations · Full text

Public Health, Preventive Medicine, Epidemiologic Methods +14

ESD On-Wafer Characterization: Is TLP Still the Right Measurement Tool?

Mirko Scholz, D. Linten, S. Thijs et al. · IEEE Transactions on Instrumentation and Measurement · 2009 · 31 citations · Full text

Engineering, Electrical Engineering, Instrumentation +16

RFCMOS ESD protection and reliability

M. Natarajan, D. Linten, S. Thijs et al. · 2005 · 19 citations

Engineering, Electrical Engineering, Hardware Security +7

Turn-off characteristics of the CMOS snapback ESD protection devices - new insights and its implications

В.А. Ващенко, Mirko Scholz, Ph. Jansen et al. · 2006 · 17 citations

Engineering, Electrical Engineering, Circuit Theory +7