Multi-sensor Metrology
Multi-Sensor Metrology is a coordinate measurement methodology that integrates data from two or more distinct sensing technologies—such as optical, tactile, and laser probes—within a single metrological framework to enhance measurement accuracy, versatility, and feature coverage on complex geometries.
50
Publications
2K
Citations
173
Authors
67
Institutions
Publications per year
2017–2026
16
Variants
Multi-sensor Coordinate Metrology
Parents
50
Advances in Large-Scale Metrology – Review and future trends
Robert Schmitt, Martin Peterek, Edward Morse et al. · CIRP Annals · 2016 · 253 citations
Engineering, Manufacturing Engineering, Materials Engineering +13
Metrological evaluation of Microsoft Kinect and Asus Xtion sensors
H. González-Jorge, B. Riveiro, Esteban Vázquez-Fernández et al. · Measurement · 2013 · 149 citations
1–5 of 50
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67

Physikalisch-Technische Bundesanstalt
Braunschweig, Germany
4 h-index
10 publications
425 citations

National Physical Laboratory
London, United Kingdom
3 h-index
8 publications
605 citations

Cracow University of Technology
Krakow, Poland
3 h-index
3 publications
69 citations

Beihang University
Beijing, China
3 h-index
8 publications
197 citations
Politecnico di Torino
Turin, Italy
3 h-index
9 publications
693 citations
Tianjin University
Tianjin, China
3 h-index
11 publications
198 citations

University of Nottingham
Nottingham, United Kingdom
2 h-index
8 publications
186 citations

University of North Carolina at Charlotte
Charlotte, United States
2 h-index
5 publications
608 citations
1–8 of 67
5 publications · 182 citations
5
h-index
5 publications · 245 citations
5
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4 publications · 113 citations
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4 publications · 96 citations
4
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3 publications · 97 citations
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1–5