Memory-based Physical Unclonable Functions

Memory-Based Physical Unclonable Functions is a type of Physical Unclonable Function that exploits the inherent manufacturing variations in memory cells to generate unique,不可克隆的 device identifiers through their unpredictable startup states or response behaviors.

Publications

3.1K

Citations

235

Authors

Institutions

Publications per year

2017–2026

Parents

Physical Unclonable Functions

Publications

Extended abstract: The butterfly PUF protecting IP on every FPGA

Sandeep Kumar, Jorge Guajardo, Roel Maes et al. · 2008 · 540 citations

Engineering, Computer Engineering, Computer Science +16

DRAM-Based Intrinsic Physically Unclonable Functions for System-Level Security and Authentication

Fatemeh Tehranipoor, Nima Karimian, Wei Yan et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2016 · 157 citations

Computing, Computer Engineering, Computer Science +14

The DRAM Latency PUF: Quickly Evaluating Physical Unclonable Functions by Exploiting the Latency-Reliability Tradeoff in Modern Commodity DRAM Devices

Jeremie S. Kim, Minesh Patel, Hasan Hassan et al. · 2018 · 138 citations

Computing, Computer Engineering, Computer Science +14

Experimental evaluation of Physically Unclonable Functions in 65 nm CMOS

Roel Maes, Vladimir Rožić, Ingrid Verbauwhede et al. · 2012 · 132 citations

Engineering, Computer Engineering, Electrical Engineering +17

Invasive PUF Analysis

Dmitry Nedospasov, Jean‐Pierre Seifert, Clemens Helfmeier et al. · 2013 · 120 citations

Computing, Computer Engineering, Electrical Engineering +14

1–5 of 59

Authors

235

CC
Chip-Hong Chang
Nanyang Technological University, Singapore
6 publications · 330 citations
6
h-index
ZH
Zhi Hui Kong
Nanyang Technological University, Singapore
6 publications · 330 citations
6
h-index
AS
Ahmad‐Reza Sadeghi
Technische Universität Darmstadt, Germany
4 publications · 216 citations
4
h-index
PK
Patrick Koeberl
Intel (United States), United States
3 publications · 305 citations
3
h-index
JA
John A. Chandy
University of Connecticut, United States
3 publications · 280 citations
3
h-index

1–5 of 235

Institutions

1–8 of 86

Venues

IEEE Transactions on Electron Devices
3 publications · 66 citations
2
h-index
IEEE Electron Device Letters
2 publications · 45 citations
2
h-index
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015
Conference · 2 publications · 65 citations
2
h-index
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
2 publications · 186 citations
2
h-index
IEEE Transactions on Information Forensics and Security
2 publications · 138 citations
2
h-index

1–5