Junction Modeling
Junction Modeling is a theoretical framework in semiconductor physics that mathematically characterizes the behavior of charge carriers at a p-n junction under varying electrical and thermal conditions, distinguishing itself by enabling the prediction of current-voltage characteristics and depletion region dynamics in semiconductor devices.
770
Publications
29.6K
Citations
2.2K
Authors
681
Institutions
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2017–2026
84
Parents
770
Ionization Rates of Holes and Electrons in Silicon
C. A. Lee, R. A. Logan, R. L. Batdorf et al. · Physical Review · 1964 · 475 citations
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Centre National de la Recherche Scientifique
Paris, France
16 h-index
76 publications
2.3K citations
University of Cambridge
Cambridge, United Kingdom
15 h-index
33 publications
1.8K citations
IBM Research - Thomas J. Watson Research Center
Yorktown Heights, United States
11 h-index
42 publications
3.3K citations
Technical University of Denmark
Kongens Lyngby, Denmark
10 h-index
27 publications
1.5K citations

University of Salerno
Fisciano, Italy
10 h-index
20 publications
551 citations

University of Naples Federico II
Naples, Italy
10 h-index
27 publications
713 citations
École Polytechnique Fédérale de Lausanne
Lausanne, Switzerland
10 h-index
32 publications
639 citations
Philips (Netherlands)
Amsterdam, The Netherlands
10 h-index
29 publications
2.1K citations
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98 publications · 3.8K citations
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68 publications · 2.8K citations
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52 publications · 1.4K citations
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31 publications · 1.1K citations
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PRB · 30 publications · 957 citations
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