Junction Modeling

Junction Modeling is a theoretical framework in semiconductor physics that mathematically characterizes the behavior of charge carriers at a p-n junction under varying electrical and thermal conditions, distinguishing itself by enabling the prediction of current-voltage characteristics and depletion region dynamics in semiconductor devices.

770

Publications

29.6K

Citations

2.2K

Authors

681

Institutions

Publications per year

2017–2026

84

Authors

2.2K

  1. FU
    Florin Udrea

    University of Cambridge, United Kingdom

    8 publications · 645 citations

    8

    h-index

  2. JH
    J.L. Hudgins

    University of South Carolina, United States

    7 publications · 199 citations

    7

    h-index

  3. ES
    Enrico Santi

    University of South Carolina, United States

    7 publications · 199 citations

    7

    h-index

  4. SB
    Salvatore Bellone

    University of Salerno, Italy

    6 publications · 101 citations

    6

    h-index

  5. JJ
    Juin J. Liou

    University of Central Florida, United States

    6 publications · 121 citations

    6

    h-index

1–5 of 2.2K

Venues

  1. IEEE Transactions on Electron Devices

    98 publications · 3.8K citations

    31

    h-index

  2. Journal of Applied Physics

    68 publications · 2.8K citations

    25

    h-index

  3. Solid-State Electronics

    52 publications · 1.4K citations

    21

    h-index

  4. Applied Physics Letters

    31 publications · 1.1K citations

    18

    h-index

  5. Physical review. B, Condensed matter

    PRB · 30 publications · 957 citations

    18

    h-index

1–5