Finite Element Device Simulation

Finite Element Device Simulation is a computational modeling approach within device simulation that discretizes the device domain into finite elements to numerically solve partial differential equations governing physical phenomena, distinguishing itself by its use of variational methods and adaptive meshing for high-fidelity spatial resolution of complex geometries and material heterogeneities.

129

Publications

4.6K

Citations

448

Authors

175

Institutions

Publications per year

2017–2026

27

Authors

448

  1. AJ
    Antonio J. García‐Loureiro

    Universidade de Santiago de Compostela, Spain

    3 publications · 99 citations

    3

    h-index

  2. RL
    R.J. Lomax

    University of Michigan, United States

    3 publications · 120 citations

    3

    h-index

  3. BZ
    Bo Zhang

    University of Electronic Science and Technology of China, China

    1 publications · 102 citations

    2

    h-index

  4. VP
    V.P. Plessky

    Helsinki Institute of Physics, Finland

    2 publications · 110 citations

    2

    h-index

  5. WY
    Wei Yang

    University of Electronic Science and Technology of China, China

    2 publications · 23 citations

    2

    h-index

1–5 of 448

Venues

  1. IEEE Transactions on Electron Devices

    10 publications · 302 citations

    10

    h-index

  2. Applied Physics Letters

    8 publications · 164 citations

    8

    h-index

  3. 5

    h-index

  4. IEEE Transactions on Magnetics

    4 publications · 145 citations

    4

    h-index

  5. IEEE Transactions on Power Electronics

    3 publications · 91 citations

    4

    h-index

1–5