Field-programmable Gate Array Testability

Field-Programmable Gate Array Testability is a design-for-testability methodology that enables the systematic evaluation and enhancement of test access, fault detection, and diagnostic resolution specifically within reconfigurable digital circuits implemented on field-programmable gate arrays by integrating configurable test architectures and automated test pattern generation techniques tailored to their programmable interconnect and logic block structures.

144

Publications

4.4K

Citations

322

Authors

110

Institutions

Publications per year

2017–2026

Parents

Design For Testability

Publications

144

The rosetta experiment: atmospheric soft error rate testing in differing technology FPGAs

Austin Lesea, Saar Drimer, J. Fabula et al. · IEEE Transactions on Device and Materials Reliability · 2005 · 202 citations

Engineering, Computer Engineering, Electrical Engineering +15

Testing the interconnect of RAM-based FPGAs

M. Renovell, J.M. Portal, Joan Figueras et al. · IEEE Design & Test of Computers · 1998 · 159 citations

Engineering, Computer Engineering, Computer Science +15

Built-in self-test of FPGA interconnect

Charles E. Stroud, Sajith Wijesuriya, C. Hamilton et al. · 2002 · 157 citations

Engineering, Computer Engineering, Electrical Engineering +17

Test of RAM-based FPGA: methodology and application to the interconnect

M. Renovell, Joan Figueras, Y. Zorian · 2002 · 115 citations

Engineering, Computer Engineering, Computer Science +8

An approach for testing programmable/configurable field programmable gate arrays

Wei Huang, Fabrizio Lombardi · 2002 · 107 citations

Engineering, Computer Engineering, Computer Science +16

1–5 of 144

Authors

322

CE
Charles E. Stroud
University of Kentucky, United States
16 publications · 704 citations
15
h-index
MR
M. Renovell
Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier, France
17 publications · 658 citations
13
h-index
FL
Fabrizio Lombardi
Northeastern University, United States
14 publications · 476 citations
12
h-index
YZ
Y. Zorian
Cirrus Logic (United States), United States
12 publications · 567 citations
11
h-index
JP
J.M. Portal
Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier, France
10 publications · 408 citations
10
h-index

1–5 of 322

Institutions

110

1–8 of 110

Venues

Journal of Electronic Testing
JETTA · 5 publications · 111 citations
5
h-index
IEEE Transactions on Nuclear Science
4 publications · 79 citations
4
h-index
IEEE Transactions on Computers
3 publications · 59 citations
3
h-index
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
3 publications · 190 citations
3
h-index
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
3 publications · 78 citations
3
h-index

1–5