Escaped Defects

Escaped Defects is a software quality metric that quantifies the number of defects that are not detected and resolved during development or testing phases and are subsequently discovered by end users in the production environment.

7

Publications

136

Citations

18

Authors

10

Institutions

Publications per year

2017–2026

1

Variants

Escaped Defect

Authors

18

  1. VB
    Valeria Bertacco

    University of Michigan, United States

    2 publications · 48 citations

    2

    h-index

  2. IW
    Ilya Wagner

    University of Michigan, United States

    2 publications · 48 citations

    2

    h-index

  3. MI
    Michiko Inoue

    Nara Institute of Science and Technology, Japan

    1 publications · 19 citations

    1

    h-index

  4. AT
    A. Touati

    Centre National de la Recherche Scientifique, France

    1 publications · 10 citations

    1

    h-index

  5. HS
    Hema Srikanth

    IBM (United States), United States

    1 publications · 23 citations

    1

    h-index

1–5 of 18

Venues

  1. Design, Automation, and Test in Europe

    Conference · 1 publications · 27 citations

    1

    h-index

  2. IEEE Transactions on Emerging Topics in Computing

    ITETBT · 1 publications · 10 citations

    1

    h-index

  3. Journal of Electronic Testing

    JETTA · 1 publications · 12 citations

    1

    h-index

  4. IEEE Software

    1 publications · 24 citations

    1

    h-index

1–4